Glue Film Thickness Measurements by Spectral Reflectance

Marshall, B. R.

National Security Technologies, LLC (United States)

关键词: 46 Instrumentation Related To Nuclear Science And Technology;    Spectral Reflectance;    Windows Glue Film, Thickness, Measurements, Spectral Reflectance;    Thickness;    Lithium Fluorides;   

DOI  :  10.2172/991875
RP-ID  :  DOE/NV/25946--1078
RP-ID  :  DE-AC52-06NA25946
RP-ID  :  991875

美国|英语

来源: UNT Digital Library

【 摘 要 】

Spectral reflectance was used to determine the thickness of thin glue layers in a study of the effect of the glue on radiance and reflectance measurements of shocked-tin substrates attached to lithium fluoride windows. Measurements based on profilometry of the components were found to be inaccurate due to flatness variations and deformation of the tin substrate under pressure during the gluing process. The accuracy of the spectral reflectance measurements were estimated to be ±0.5 μm, which was sufficient to demonstrate a convincing correlation between glue thickness and shock-generated light.