Phonon engineering for nanostructures.

Aubry, Sylvie (Stanford University) ; Friedmann, Thomas Aquinas ; Sullivan, John Patrick ; Peebles, Diane Elaine ; Hurley, David H. (Idaho National Laboratory) ; Shinde, Subhash L. ; Piekos, Edward Stanley ; Emerson, John Allen

Sandia National Laboratories

关键词: Phonon Transport;    Nanostructures;    Nanostructure Materials.;    Phonons;    Substrates;   

DOI  :  10.2172/984139
RP-ID  :  SAND2010-0326
RP-ID  :  AC04-94AL85000
RP-ID  :  984139

美国|英语

来源: UNT Digital Library

【 摘 要 】

Understanding the physics of phonon transport at small length scales is increasingly important for basic research in nanoelectronics, optoelectronics, nanomechanics, and thermoelectrics. We conducted several studies to develop an understanding of phonon behavior in very small structures. This report describes the modeling, experimental, and fabrication activities used to explore phonon transport across and along material interfaces and through nanopatterned structures. Toward the understanding of phonon transport across interfaces, we computed the Kapitza conductance for {Sigma}29(001) and {Sigma}3(111) interfaces in silicon, fabricated the interfaces in single-crystal silicon substrates, and used picosecond laser pulses to image the thermal waves crossing the interfaces. Toward the understanding of phonon transport along interfaces, we designed and fabricated a unique differential test structure that can measure the proportion of specular to diffuse thermal phonon scattering from silicon surfaces. Phonon-scale simulation of the test ligaments, as well as continuum scale modeling of the complete experiment, confirmed its sensitivity to surface scattering. To further our understanding of phonon transport through nanostructures, we fabricated microscale-patterned structures in diamond thin films.