The Sandia MEMS Passive Shock Sensor : FY08 failure analysis activities.

Walraven, Jeremy Allen ; Baker, Michael Sean ; Clemens, Rebecca C. ; Mitchell, John Anthony ; Brake, Matthew Robert ; Epp, David S. ; Wittwer, Jonathan W.

Sandia National Laboratories

关键词: Sensors.;    Microelectronics Sensors.;    42 Engineering;    Microelectromechanical Systems.;    Sensors;   

DOI  :  10.2172/939847
RP-ID  :  SAND2008-5185
RP-ID  :  AC04-94AL85000
RP-ID  :  939847

美国|英语

来源: UNT Digital Library

【 摘 要 】

No abstract prepared.