Radiation aging of stockpile and space-based microelectronics.

Hembree, Charles Edward ; Hjalmarson, Harold Paul

Sandia National Laboratories

关键词: Aging;    46 Instrumentation Related To Nuclear Science And Technology;    Ionizing Radiations;    Microelectronics;    Radiation Effects;   

DOI  :  10.2172/918391
RP-ID  :  SAND2003-4783
RP-ID  :  AC04-94AL85000
RP-ID  :  918391

美国|英语

来源: UNT Digital Library

【 摘 要 】

This report describes an LDRD-supported experimental-theoretical collaboration on the enhanced low-dose-rate sensitivity (ELDRS) problem. The experimental work led to a method for elimination of ELDRS, and the theoretical work led to a suite of bimolecular mechanisms that explain ELDRS and is in good agreement with various ELDRS experiments. The model shows that the radiation effects are linear in the limit of very low dose rates. In this limit, the regime of most concern, the model provides a good estimate of the worst-case effects of low dose rate ionizing radiation.