X-Ray Diffraction Project Final Report, Fiscal Year 2006

Morgan, Dane V.

National Security Technologies, LLC

关键词: Signal-To-Noise Ratio;    46 Instrumentation Related To Nuclear Science And Technology;    Cameras;    Dynamic X-Ray Diffraction, Si Crystals, Supersaver Marx;    Phosphors;   

DOI  :  10.2172/914425
RP-ID  :  DOE/NV/25946--078
RP-ID  :  DE-AC52-06NA25946
RP-ID  :  914425

美国|英语

来源: UNT Digital Library

【 摘 要 】

An x-ray diffraction diagnostic system was developed for determining real-time shock-driven lattice parameter shifts in single crystals at the gas gun at TA-IV at Sandia National Laboratories (SNL). The signal-to-noise ratio and resolution of the system were measured using imaging plates as the detector and by varying the slit width. This report includes tests of the x-ray diffraction system using a phosphor coupled to a charge-coupled device (CCD) camera by a coherent fiber-optic bundle. The system timing delay was measured with a newly installed transistor-transistor logic (TTL) bypass designed to reduce the x-ray delay time. The axial misalignment of the Bragg planes was determined with respect to the optical axis for a set of eight LiF [lithium fluoride] crystals provided by SNL to determine their suitability for gas gun experiments.