Dual Beam FIB for Imaging, Nano-Sectioning and Sample Preparation of Spores: Initial Results.

Wall, M A ; Fluss, M J ; Schaldach, C

Lawrence Livermore National Laboratory

关键词: Lawrence Livermore National Laboratory;    Bacillus;    36 Materials Science;    Ion Beams;    59 Basic Biological Sciences;   

DOI  :  10.2172/892791
RP-ID  :  UCRL-TR-203819
RP-ID  :  W-7405-ENG-48
RP-ID  :  892791

美国|英语

来源: UNT Digital Library

【 摘 要 】

Results from the first use of Focused Ion Beam (FIB) technology to section Bacillus spores at LLNL in a dual-beam (electron and ion) instrument is presented and discussed. With the use of a dual-beam instrument, high resolution imaging of single spores using low voltage scanning electron microscopy followed by FIB sectioning, SEM imaging of internal structure of the same spore is demonstrated to be possible. Additionally, FIB is shown to be able to precisely micro-machine spores thus potentially facilitating micro-scale experiments on single spores.