Single Ion Trapping for the Enriched Xenon Observatory

Waldman, Samuel J. ; /Stanford U., Phys. Dept. /SLAC

Stanford Linear Accelerator Center

关键词: Daughter Products;    Decay;    Double Beta Decay;    Xenon Astrophysics,Astro;    Spectroscopy;   

DOI  :  10.2172/878352
RP-ID  :  SLAC-R-813
RP-ID  :  AC02-76SF00515
RP-ID  :  878352

美国|英语

来源: UNT Digital Library

【 摘 要 】

In the last decade, a variety of neutrino oscillation experiments have established that there is a mass difference between neutrino flavors, without determining the absolute neutrino mass scale. The Enriched Xenon Observatory for neutrinoless double beta decay (EXO) will search for the rare decays of xenon to determine the absolute value of the neutrino mass. The experiment uses a novel technique to minimize backgrounds, identifying the decay daughter product in real time using single ion spectroscopy. Here, we describe single ion trapping and spectroscopy compatible with the EXO detector. We extend the technique of single ion trapping in ultrahigh vacuum to trapping in xenon gas. With this technique, EXO will achieve a neutrino mass sensitivity of {approx_equal} .010 eV.