High-Frequency Electromagnetic Impedance Measurements for Characterization, Monitoring and Verification Efforts

Lee, Ki Ha ; Becker, Alex ; Tseng, Hung-Wen ; Choi, Youngki

Lawrence Berkeley National Laboratory

关键词: Dielectric Materials;    Monitoring;    36 Materials Science;    Containment;    Targets;   

DOI  :  10.2172/834455
RP-ID  :  EMSP-73776-2001
RP-ID  :  834455

美国|英语

来源: UNT Digital Library

【 摘 要 】

Non-invasive, high-resolution imaging of the shallow subsurface is needed for delineation of buried waste, detection of unexploded ordinance, verification and monitoring of containment structures, and other environmental applications. Electromagnetic (EM) measurements at frequencies between 1 and 100 MHz are important for such applications, because the induction number of many targets is small and the ability to determine the dielectric permittivity in addition to electrical conductivity of the subsurface is possible. Earlier workers were successful in developing systems for detecting anomalous areas, but no quantifiable information was accurately determined. For high-resolution imaging, accurate measurements are necessary so the field data can be mapped into the space of the subsurface parameters. We are developing a non-invasive method for accurately mapping the electrical conductivity and dielectric permittivity of the shallow subsurface using the EM impedance approach (Frangos, 2001; Lee and Becker, 2001). Electric and magnetic sensors are being tested in a known area against theoretical predictions, thereby insuring that the data collected with the high-frequency impedance (HFI) system will support high-resolution, multi-dimensional imaging techniques.