TPV Network Sensitivity: A Simulation Study

Vell, J.L. ; Oppenlander, J.E. ; Gaes, W.S. ; Siganporia, D.M. ; Danielson, L.R.

Lockheed Martin

关键词: 42 Engineering;    Simulation;    Breakdown;    Sensitivity;    Performance;   

DOI  :  10.2172/822280
RP-ID  :  LM-03K152
RP-ID  :  AC12-00SN39357
RP-ID  :  822280

美国|英语

来源: UNT Digital Library

【 摘 要 】

A viable thermophotovoltaic power conversion system requires an electrically connected network of diodes that is designed to be fault tolerant for a prescribed power rating and generator life. This paper describes simulation studies investigating the sensitivity of various series/parallel network configurations to diode variability. The results show the effect of diode mismatch and reverse breakdown behavior on network performance.