Development of instrumentation for surface, interface and thin film science at the Advanced Photon Source. Final Technical Report for period September 15, 1994 - September 14, 2000

Bedzyk, Michael J.

Northwestern University (Evanston, Ill.). Department of Materials Science and Engineering.

关键词: Advanced Photon Source;    Surfaces;    46 Instrumentation Related To Nuclear Science And Technology;    Testing;    Advanced Photon Source;   

DOI  :  10.2172/811794
RP-ID  :  DOE/ER/45527-1
RP-ID  :  FG02-49ER45527
RP-ID  :  811794

美国|英语

来源: UNT Digital Library

【 摘 要 】

The P.I. and his research term successfully used the funds from the DOE Instrumentation grant entitled ''Development of Instrumentation for Surface, Interface and Thin Film Science at the Advanced Photon Source'' to design, build, test, and commission a customized surface science x-ray scattering/spectroscopy chamber. This instrumentation, which is presently in use at an APS x-ray undulator beam line operated by the DuPont-Northwestern-Dow Collaborative Access Team, is used for x-ray measurements of surface, interface, thin film, and nano-structures.