A Theory for RF and Microwave Scalar Reflectometers

MOYER, ROBERT D.

Sandia National Laboratories

关键词: Reflection;    Rf Systems;    Measuring Instruments;    47 Other Instrumentation;    Performance;   

DOI  :  10.2172/811718
RP-ID  :  SAND2003-1352
RP-ID  :  AC04-94AL85000
RP-ID  :  811718

美国|英语

来源: UNT Digital Library

【 摘 要 】

A careful analysis of rf and microwave scalar reflectometers is conducted to (1) reveal the advantages of 4-port over 3-port reflectometers, (2) show the advantage--and remaining weaknesses--of a reflectometer initialized by the open/short method and (3) present expressions for the worst-case errors in scalar reflectometer measurements.