Solid-State Modular Testing

Cook, E. G.

Lawrence Livermore National Laboratory

关键词: Mosfet;    Testing;    Transformers;    Printed Circuits;    Switches;   

DOI  :  10.2172/792255
RP-ID  :  UCRL-ID-136932
RP-ID  :  W-7405-Eng-48
RP-ID  :  792255

美国|英语

来源: UNT Digital Library

【 摘 要 】

In this note is reported the testing of the pre-production version of a solid-state adder type modulator. In this configuration, the adder consists of transformers that are driven by an array of MOSFET switches that are connected in parallel but not in series; i.e. the input voltage on the transformer is limited to the maximum voltage rating on the MOSFETs. At present, there are only enough printed circuit boards (MOSFET carrier boards) to drive four transformers and two of those are prototypes that are restricted by their gate drive circuits to a minimum output pulse width of {approx}100ns. We also have two pre-production boards that meet all of our requirements for rise and fall-times and minimum pulse width. The remainder of the production boards are due to be delivered in the first week in January and should give us full high voltage capability.