Electroabsorption and Transport Measurements and Modeling Research in Amorphous Silicon Based Solar Cells; Annual Report; 24 March 1999-23 March 2000 | |
Schiff, E.A. ; Kopidakis, N. ; Lyou, J. ; Rane, S. ; Yuan, Q. ; Zhu, K. (Syracuse University) | |
National Renewable Energy Laboratory (U.S.) | |
关键词: P/I; 14 Solar Energy; Pin Solar Cells; Transport Measurements; Solar Cells; | |
DOI : 10.2172/777315 RP-ID : NREL/SR-520-29504 RP-ID : AC36-99GO10337 RP-ID : 777315 |
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美国|英语 | |
来源: UNT Digital Library | |
【 摘 要 】
We have performed computer calculations to explore effects of the p/i interface on the open-circuit voltage in a-Si:H based pin solar cells. The principal conclusions are that interface limitation can occur for values of VOC significantly below the built-in potential of VBI of a cell, and that the effects can be understood in terms of thermionic emission of electrons from the intrinsic layer into the p-layer. We compare measurements of VOC and electroabsorption estimates of VBI with the model calculations. We conclude that p/i interface limitation is important for current a-Si:H based cells, and that the conduction band offset between the p and i layers is as important as the built-in potential for future improvements to VOC.
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