Nanostructure of a-Si:H and Related Alloys by Small-Angle Scattering of Neutrons and X-Rays: Final Technical Progress Report, 22 May 1998 - 15 October 2001

Williamson, D. L.

National Renewable Energy Laboratory (U.S.)

关键词: Polymorphous Si:H;    Alloys;    Pv;    Small-Angle Neutron Scattering;    08 Hydrogen;   

DOI  :  10.2172/15000387
RP-ID  :  NREL/SR-520-31908
RP-ID  :  AC36-99-GO10337
RP-ID  :  15000387

美国|英语

来源: UNT Digital Library

【 摘 要 】

This report describes work performed to provide details of the microstructure in high-quality hydrogenated amorphous and microcrystalline silicon and related alloys on the nanometer size scale. The materials studied were prepared by current state-of-the-art deposition methods as well as by new and emerging deposition techniques. The purpose is to establish the role of nanostructural features in controlling the opto-electronic and photovoltaic properties. The approach centered around the use of the uncommon technique of small-angle scattering of both x-rays (SAXS) and neutrons (SANS). SAXS has already been established as highly sensitive to microvoids and columnar-like microstructure. A major goal of this research was to establish the ability of SANS to detect hydrogen inhomogeneity in device-quality materials. This was demonstrated and new information on various materials have been provided. Conventional X-ray diffraction techniques were used to examine medium-range order and microcrystallinity, particularly near the boundary between amorphous and microcrystalline material.