Finite-element analysis of the deformation of thin Mylar films due to measurement forces.

Baker, Michael Sean ; Robinson, Alex Lockwood ; Tran, Hy D.

Sandia National Laboratories

关键词: Thickness;    Testing;    Polyethylenes;    Absorption;    Refractive Index;   

DOI  :  10.2172/1034880
RP-ID  :  SAND2012-0186
RP-ID  :  AC04-94AL85000
RP-ID  :  1034880

美国|英语

来源: UNT Digital Library

【 摘 要 】

Significant deformation of thin films occurs when measuring thickness by mechanical means. This source of measurement error can lead to underestimating film thickness if proper corrections are not made. Analytical solutions exist for Hertzian contact deformation, but these solutions assume relatively large geometries. If the film being measured is thin, the analytical Hertzian assumptions are not appropriate. ANSYS is used to model the contact deformation of a 48 gauge Mylar film under bearing load, supported by a stiffer material. Simulation results are presented and compared to other correction estimates. Ideal, semi-infinite, and constrained properties of the film and the measurement tools are considered.