Harmful Shunting Mechanisms Found in Silicon Solar Cells (Fact Sheet)

National Renewable Energy Laboratory (U.S.)

关键词: Breakdown;    Solar Cells;    36 Materials Science;    Impurities;    Manufacturing;   

DOI  :  10.2172/1016431
RP-ID  :  NREL/FS-5200-51411
RP-ID  :  AC36-08GO28308
RP-ID  :  1016431

美国|英语

来源: UNT Digital Library

【 摘 要 】

Scientists developed near-field optical microscopy for imaging electrical breakdown in solar cells and identified critical electrical breakdown mechanisms operating in industrial silicon and epitaxial silicon solar cells.