科技报告详细信息
Electrical Characterization of Printed Nanocrystalline Silicon Films, Cooperative Research and Development Final Report, CRADA Number CRD-07-00241 | |
Young, D. | |
National Renewable Energy Laboratory (U.S.) | |
关键词: 14 Solar Energy; Silicon Crada; 36 Materials Science; Microscopy; Commercialization And Technology Transfer; | |
DOI : 10.2172/1013908 RP-ID : NREL/TP-7A10-50944 RP-ID : AC36-08GO28308 RP-ID : 1013908 |
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美国|英语 | |
来源: UNT Digital Library | |
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【 摘 要 】
This CRADA helped Innovalight characterize and quantify their ink-based selective emitter technology. Controlled localized doping of selective emitter structures via Innovalight Silicon Ink technology was demonstrated. Both secondary ion mass spectrometry and scanning capacitance microscopy revealed; abrupt lateral dopant profiles at ink-printed boundaries. Uniform doping of iso- and pyramidal surfaces was also verified using scanning electron microscopy dopant contrast imaging.【 预 览 】
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1013908.pdf | 457KB | ![]() |