The Sandia MEMS Passive Shock Sensor : dormancy and aging.

Baker, Michael Sean ; Tanner, Danelle Mary

Sandia National Laboratories

关键词: Aging;    Performance Testing;    Microelectronic Circuits;    Sensors;    Shock Waves;   

DOI  :  10.2172/1008111
RP-ID  :  SAND2010-6943
RP-ID  :  AC04-94AL85000
RP-ID  :  1008111

美国|英语

来源: UNT Digital Library

【 摘 要 】

This report presents the results of an aging experiment that was established in FY09 and completed in FY10 for the Sandia MEMS Passive Shock Sensor. A total of 37 packages were aged at different temperatures and times, and were then tested after aging to determine functionality. Aging temperatures were selected at 100 C and 150 C, with times ranging from as short as 100 hours to as long as 1 year to simulate a predicted aging of up to 20 years. In all of the tests and controls, 100% of the devices continued to function normally.