Final report on LDRD project 105967 : exploring the increase in GaAs photodiode responsivity with increased neutron fluence.

Blansett, Ethan L. ; Geib, Kent Martin ; Cich, Michael Joseph ; Wrobel, Theodore Frank ; Peake, Gregory Merwin ; Fleming, Robert M. ; Serkland, Darwin Keith ; Wrobel, Diana L.

关键词: DEFECTS;    ELECTRONS;    FABRICATION;    IRRADIATION;    LINEAR ACCELERATORS;    MISSILES;    NEUTRON FLUENCE;    NEUTRONS;    PERFORMANCE;    PHOTODIODES;    PULSED REACTORS;    RADIATIONS;    SILICON;    SIMULATION Irradiation-Testing.;    Neutron irradiation.;    Gallium arsenide.;    Gallium arsenide semiconductors-Testing.;   

DOI  :  10.2172/934851
RP-ID  :  SAND2007-8095
PID  :  OSTI ID: 934851
Others  :  TRN: US0804099

美国|英语

来源: SciTech Connect

【 摘 要 】

A previous LDRD studying radiation hardened optoelectronic components for space-based applications led to the result that increased neutron irradiation from a fast-burst reactor caused increased responsivity in GaAs photodiodes up to a total fluence of 4.4 x 10{sup 13} neutrons/cm{sup 2} (1 MeV Eq., Si). The silicon photodiodes experienced significant degradation. Scientific literature shows that neutrons can both cause defects as well as potentially remove defects in an annealing-like process in GaAs. Though there has been some modeling that suggests how fabrication and radiation-induced defects can migrate to surfaces and interfaces in GaAs and lead to an ordering effect, it is important to consider how these processes affect the performance of devices, such as the basic GaAs p-i-n photodiode. In this LDRD, we manufactured GaAs photodiodes at the MESA facility, irradiated them with electrons and neutrons at the White Sands Missile Range Linac and Fast Burst Reactor, and performed measurements to show the effect of irradiation on dark current, responsivity and high-speed bandwidth.