Total Energy CMR Production

Friedrich, S ; Kolagani, R M

关键词: BUFFERS;    CHEMICAL REACTIONS;    DEPOSITION;    EPITAXY;    LASERS;    PRODUCTION;    SENSITIVITY;    STRAINS;   

DOI  :  10.2172/945555
RP-ID  :  LLNL-TR-406972
PID  :  OSTI ID: 945555
Others  :  TRN: US0901212

美国|英语

来源: SciTech Connect

【 摘 要 】

The following outlines the optimized pulsed laser deposition (PLD) procedure used to prepare Nd{sub 0.67}Sr{sub 0.33}MnO{sub 3} (NSMO) temperature sensors at Towson University (Prof. Rajeswari Kolagani) for the LCLS XTOD Total Energy Monitor. The samples have a sharp metal/insulator transition at T {approx} 200 K and are optimized for operation at T {approx} 180 K, where their sensitivity is the highest. These samples are epitaxial multilayer structures of Si/YSZ/CeO/NSMO, where these abbreviations are defined in table 1. In this heterostructure, YSZ serves as a buffer layer to prevent deleterious chemical reactions, and also serves to de-oxygenate the amorphous SiO{sub 2} surface layer to generate a crystalline template for epitaxy. CeO and BTO serve as template layers to minimize the effects of thermal and lattice mismatch strains, respectively. More details on the buffer and template layer scheme are included in the attached manuscript accepted for publication in Sensor Letters (G. Yong et al., 2008).