Characterization of the Electronic and Chemical Structure at the Thin Film Solar Cell Interfaces: June 2005 -- June 2009

Heske, C.

关键词: ABSORPTION;    ELECTRONIC STRUCTURE;    PHOTOELECTRON SPECTROSCOPY;    PHOTOEMISSION;    SOLAR CELLS;    THIN FILMS PV;    CIGSS;    CDTE;    ELECTRONIC STRUCTURE;    INTERFACES;    THIN FILM;    SOLAR CELLS;    PHOTOELECTRON SPECTROSCOPY;    INVERSE PHOTOEMISSION;    X-RAY ABSORPTION AND EMISSION;    Solar Energy - Photovoltaics;   

DOI  :  10.2172/964209
RP-ID  :  NREL/SR-520-46434
PID  :  OSTI ID: 964209
Others  :  Other: XXL-5-44206-12
Others  :  TRN: US200919%%190

美国|英语

来源: SciTech Connect

【 摘 要 】

Study using photoelectron spectroscopy, inverse photoemission, and X-ray absorption and emission to derive the electronic structure of interfaces in CIGSS and CdTe thin-film solar cells.