Electrical Characterization of Printed Nanocrystalline Silicon Films, Cooperative Research and Development Final Report, CRADA Number CRD-07-00241

Young, D.

关键词: CAPACITANCE;    MASS SPECTROSCOPY;    MICROSCOPY;    SCANNING ELECTRON MICROSCOPY;    SILICON CRADA;    INNOVALIGHT;    ELECTRICAL CHARACTERIZATION OF PRINTED NANOCRYSTALLINE SILICON FILMS;    Commercialization and Technology Transfer;   

DOI  :  10.2172/1013908
RP-ID  :  NREL/TP-7A10-50944
PID  :  OSTI ID: 1013908
Others  :  TRN: US201111%%153

美国|英语

来源: SciTech Connect

【 摘 要 】

This CRADA helped Innovalight characterize and quantify their ink-based selective emitter technology. Controlled localized doping of selective emitter structures via Innovalight Silicon Ink technology was demonstrated. Both secondary ion mass spectrometry and scanning capacitance microscopy revealed; abrupt lateral dopant profiles at ink-printed boundaries. Uniform doping of iso- and pyramidal surfaces was also verified using scanning electron microscopy dopant contrast imaging.