科技报告详细信息
Automated suppression of errors in LTP-II slope measurements with x-ray optics. Part1: Review of LTP errors and methods for the error reduction
Ali, Zulfiqar ; Yashchuk, Valeriy V.
关键词: surface slope metrology;    drift error;    systematic error;    optimal scanning;    metrology of x-ray optics;    deflectometry;   
DOI  :  10.2172/1170544
RP-ID  :  LBNL-5586E
PID  :  OSTI ID: 1170544
学科分类:工程和技术(综合)
美国|英语
来源: SciTech Connect
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