Thermally induced deformations in a partially coated elastic layer

INTERNATIONAL JOURNAL OF SOLIDS AND STRUCTURES

卷:46

Article

Lanzoni, L.¹  Radi, E.¹ 

[1] Univ Modena & Reggio Emilia, Dipartimento Sci & Metodi Ingn, Reggio Emilia, Italy

关键词: Residual stress;    Integral equation;    Chebyshev polynomials;    Thin films;    Stress singularity;    Crystalline undulator;   

DOI  :  10.1016/j.ijsolstr.2008.11.004

来源: Elsevier

【 摘 要 】

The problem of a thin film coated on an elastic layer and subject to a thermal variation is analytically investigated in the present work. The analysis is developed in order to assess the mechanical behaviour of a crystalline undulator designed for obtaining high emission radiations through channelling phenomenon. It consists in a plane silicon wafer alternately patterned with thin films in silicon, nitride on both surfaces. The system adopts a periodic curvature as a result of the misfit strain due to the different thermal expansivities of the layer and the film. The problem is governed by an integral equation which can be reduced to a linear algebraic system by approximating the unknown interfacial shear stress via series expansion of Chebyshev polynomials. (C) 2008 Elsevier Ltd. All rights reserved.

【 授权许可】

Free