Buckling-induced dislocation emission in thin films on substrates

INTERNATIONAL JOURNAL OF SOLIDS AND STRUCTURES

卷:50

Article

Ruffini, Antoine¹  Durinck, Julien¹  Colin, Jerome¹  Coupeau, Christophe¹  Grilhe, Jean¹ 

[1] Univ Poitiers, CNRS, ENSMA, Dept Phys & Mecan Mat,Inst P, F-86962 Futuroscope, France

关键词: Thin-films;    Dislocations;    Misfit;    Buckling;    Atomistic simulations;    Analytical modelling;   

DOI  :  10.1016/j.ijsolstr.2013.07.015

来源: Elsevier

【 摘 要 】

Atomistic simulations of the evolution of a strained thin film on a substrate has been reported and the formation of dislocations has been observed in the film/substrate interface after the film has buckled. In the framework of the linear elasticity theory, an analytical model has been developed to explain the buckle effect on the formation of the dislocations. A stability diagram with respect to the buckling and dislocation emission phenomena is finally presented for the film as a function of the uniaxial strain and the Burgers vector. (C) 2013 Elsevier Ltd. All rights reserved.

【 授权许可】

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