Nanostructural organization of thin films prepared by sequential dip-coating deposition of poly(butylene succinate), poly(ε-caprolactone) and their copolyesters (PBS-ran-PCL)

POLYMER

卷:226

Article

Ivan Penas, Mario^1,2  Ocando, Connie²  Penott-Chang, Evis³  Safari, Maryam²  Ezquerra, Tiberio A.⁴  Rebollar, Esther⁵  Nogales, Aurora⁴  Hernandez, Rebeca¹  Mueller, Alejandro J.^2,3,6 

[1] CSIC, Inst Ciencia & Tecnol Polimeros, ICTP, Juan Cierva 3, E-28006 Madrid 3, Spain

[2] Univ Basque Country, Fac Quim, POLYMAT, UPV EHU, Paseo Manuel Lardizabal 3, Donostia San Sebastian 20018, Spain

[3] Univ Simon Bolivar, Dept Ciencias Mat, Grp Polimeros I USB, Caracas 1080A, Venezuela

[4] CSIC, Inst Estruct Mat, IEM, Serrano 121, E-28006 Madrid, Spain

[5] CSIC, Inst Quim Fis Rocasolano, IQFR, Serrano 119, E-28006 Madrid, Spain

[6] Ikerbasque, Basque Fdn Sci, Bilbao, Spain

关键词: Poly(epsilon-caprolactone);    poly(butylene succinate);    Random copolyesters;    Thin-films;    Layer-by-layer dip-coating;    s-SNOM;    nano-FTIR;   

DOI  :  10.1016/j.polymer.2021.123812

来源: Elsevier

【 摘 要 】

In this work, we prepare and characterize multiphasic thin films containing poly(epsilon-caprolactone), PCL, poly (butylene succinate), PBS, and a poly (butylene succinate-ran-epsilon-caprolactone) (PBS-ran-PCL) random copolyester. To that aim, thin films were prepared by sequential dipping of a silicon substrate into chloroform solutions of the respective polymers. The preparation method resulted in films with varying compositions of PCL and PBS components depending on the initial concentration of the dipping solutions and the number of dipping steps employed for the preparation of the samples. Atomic force microscopy (AFM), grazing incidence X-ray scattering at wide angle (GIWAXS) and scattering-type scanning near-field optical microscopy (s-SNOM) and Fourier transform infrared nanospectroscopy (nano-FTIR) were employed to characterize the films obtained. As chloroform can dissolve all components, the final composition of the film was always rich in the last deposited layer component. The thin films obtained were semicrystalline with a complex axialitic or dendritic morphology of the dominant component (that one deposited last) with traces of the other components, whose presence and location was revealed by s-SNOM/nano-FTIR.

【 授权许可】

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