On testing pseudorandom generators via statistical tests based on the arcsine law

JOURNAL OF COMPUTATIONAL AND APPLIED MATHEMATICS

卷:380

Article

Lorek, Pawel¹  Los, Grzegorz²  Gotfryd, Karol³  Zagorski, Filip³ 

[1] Univ Wroclaw, Math Inst, Pl Grunwaldzki 2-4, PL-50384 Wroclaw, Poland

[2] Univ Wroclaw, Inst Comp Sci, Joliot Curie 15, PL-50383 Wroclaw, Poland

[3] Wroclaw Univ Sci & Technol, Dept Fundamentals Comp Sci, Wybrzeze Wyspianskiego 27, PL-50370 Wroclaw, Poland

关键词: The arcsine law;    Random walks;    Pseudorandom number generator;    Statistical testing;    Second level testing;    Dyck paths;   

DOI  :  10.1016/j.cam.2020.112968

来源: Elsevier

【 摘 要 】

Testing the quality of pseudorandom number generators is an important issue. Security requirements become more and more demanding, weaknesses in this matter are simply not acceptable. There is a need for an in-depth analysis of statistical tests - one has to be sure that rejecting/accepting a generator as good is not a result of errors in computations or approximations. In this paper we propose a second level statistical test based on the arcsine law for random walks. We provide upper bounds for the approximation of the arcsine distribution, what allows us to perform a detailed error analysis of the proposed test. (C) 2020 Elsevier B.V. All rights reserved.

【 授权许可】

Free