A method for quantifying in plane permeability of porous thin films

JOURNAL OF COLLOID AND INTERFACE SCIENCE

卷:530

Article

Rong, Guoguang¹  Palko, James W.^1,2  Oyarzun, Diego I.¹  Zhang, Chi¹  Hammerle, Jacob¹  Asheghi, Mehdi¹  Goodson, Kenneth E.¹  Santiago, Juan G.¹ 

[1] Stanford Univ, Dept Mech Engn, Stanford, CA 94305 USA

[2] Univ Calif, Dept Mech Engn, Merced, CA 95343 USA

关键词: Permeability;    Thin film;    Coating;    In-situ measurement;    Porous media;   

DOI  :  10.1016/j.jcis.2018.05.062

来源: Elsevier

【 摘 要 】

The in-plane permeability of porous thin films is an important fluid mechanical property that determines wicking and pressure-driven flow behavior in such materials. This property has so far been challenging to measure directly due to the small sidewall cross-sectional area of thin films available for flow. In this work, we propose and experimentally demonstrate a novel technique for directly measuring in-plane permeability of porous thin films of arbitrary thicknesses, in situ, using a manifold pressed to the top surface of the film. We both measure and simulate the influence of the two dimensional flow field produced in a film by the manifold and extract the permeability from measurements of pressure drop at fixed flow rates. Permeability values measured using the technique for a periodic array of channels are comparable to theoretical predictions. We also determine in-plane permeability of arrays of pillars and electrode posited porous copper films. This technique is a robust tool to characterize permeability of thin films of arbitrary thicknesses on a variety of substrates. In Supplementary material, we provide a solid model, which is useful in three-dimensional printer reproductions of our device. Published by Elsevier Inc.

【 授权许可】

Free