| JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 卷:401 |
| Magnetic and structural properties of MnRh thin Films | |
| Article | |
| Chaturvedi, Anurag1  Sepehri-Amin, Hossein2  Ohkubo, Tadakatsu2  Hono, Kazuhiro2  Suzuki, Takao1,3,4  | |
| [1] Univ Alabama, Ctr Mat Informat Technol, Tuscaloosa, AL 35487 USA | |
| [2] Natl Inst Mat Sci, Elements Strategy Initiat Ctr Magnet Mat, Tsukuba, Ibaraki 3050047, Japan | |
| [3] Univ Alabama, Dept Elect & Comp Engn, Tuscaloosa, AL 35487 USA | |
| [4] Univ Alabama, Dept Met & Mat Engn, Tuscaloosa, AL 35487 USA | |
| 关键词: MnRh; Thin film; First order transition; Exchange bias effect; | |
| DOI : 10.1016/j.jmmm.2015.10.027 | |
| 来源: Elsevier | |
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【 摘 要 】
A systematic study of magnetic and structural properties of MnRh thin films fabricated by sputter-deposition onto silica glass has been conducted. The MnRh thin films are found to be of the CsCI-type structure, and ferromagnetic at room temperature. The MnRh thin film undergoes the magnetic phase transition between antiferromagnetic and ferromagnetic states at a temperature around 175 K and 310 K during the cooling and heating process, respectively. The temperature dependence of the magnetization shows a thermal hysteresis of about 120 K. An exchange bias field of about 450 Oe at 5 K was observed with the coercivity of 900 Oe and unidirectional anisotropy constant of about 0.45 erg/cm(2). The magnetic field dependence of M-T shows that the transition temperature of about 230 K remains unchanged with increasing field during the temperature variation process. A detailed STEM-EDS analysis indicates a non-uniform compositional distribution of Mn and Rh with an average composition of Mn58Rh42 at%. A high resolution STEM-HAADF analysis reveals the compositional variations within the CsCI-type MnRh grains. It is proposed that the origin of exchange bias effect is resulted from the exchange coupling between the ferromagnetic region with Mn-rich and the antiferromagnetic region with nearly the equiatomic composition. (C) 2015 Elsevier B.V. All rights reserved.
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| 10_1016_j_jmmm_2015_10_027.pdf | 1905KB |
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