Bi atoms mobility-driven circular domains at the Bi/InAs(111) interface

SURFACE SCIENCE

卷:651

Article

Richter, M. C.^1,2  Mariot, J-M.^3,4  Gafoor, M. A.¹  Nicolai, L.^1,5  Heckmann, O.^1,2  Djukic, U.¹  Ndiaye, W.¹  Vobornik, I.⁶  Fujii, J.⁶  Barrett, N.²  Feyer, V.^7,8,9  Schneider, C. M.^7,8  Hricovini, K.^1,2 

[1] Univ Cergy Pontoise, Lab Phys Mat & Surfaces, 5 Mail Gay Lussac, F-95031 Cergy Pontoise, France

[2] CEA Saclay, Serv Phys Etat Condense, IRAMIS, DSM, F-91191 Gif Sur Yvette, France

[3] Univ Paris 06, Sorbonne Univ, Lab Chim Phys Matiere & Rayonnement, UMR 7614, 11 Rue Pierre & Marie Curie, F-75231 Paris 05, France

[4] CNRS, Lab Chim Phys Matiere & Rayonnement, UMR 7614, 11 Rue Pierre & Marie Curie, F-75231 Paris 05, France

[5] Univ Munich, Dept Chem, Butenandtstr 5-13, D-81377 Munich, Germany

[6] CNR, TASC Lab, Ist Officina Mat, I-34014 Trieste, Italy

[7] Res Ctr Julich, Peter Grunberg Inst PGI 6, D-52425 Julich, Germany

[8] Res Ctr Julich, JARA FIT, D-52425 Julich, Germany

[9] Sincrotrone Trieste SCpA, NanoESCA Beamline, I-34012 Trieste, Italy

关键词: Indium arsenide;    Bismuth;    Chemical reactivity;    Circular pattern morphology;    PEEM;    ARPES;   

DOI  :  10.1016/j.susc.2016.03.032

来源: Elsevier

【 摘 要 】

Bi films deposited on InAs(111) A and B sides have been studied by photoemission electron microscopy. A series of snapshots acquired during sequential annealing of the interfaces at temperatures below and above the melting temperature of Bi allowed obtaining a comprehensive image of the topographic and chemical evolutions of the Bi films that are found to be InAs side dependent. On the A side, a morphology of circular patterns controlled by Bi atoms mobility is observed. The patterns are formed on the pristine In-terminated InAs(111) surface covered by a weakly bonded Bi bilayer. On the B side, no particular morphology is observed due to a stronger chemical interaction between Bi and As atoms as evidenced by the spatially-resolved core-level photoelectron spectra. (C) 2016 Elsevier B.V. All rights reserved.

【 授权许可】

Free