SURFACE SCIENCE | 卷:605 |
Surface structure determination of silica single layer on Mo(112) by LEED | |
Article | |
Kinoshita, Tetsuhiro1  Mizuno, Seigi1  | |
[1] Kyushu Univ, Dept Mol & Mat Sci, Fukuoka 8168580, Japan | |
关键词: Low energy electron diffraction (LEED); Molybdenum; Silicon oxides; | |
DOI : 10.1016/j.susc.2011.04.003 | |
来源: Elsevier | |
【 摘 要 】
The atomic structure of silica single layer on a Mo(112) substrate was determined by means of low-energy electron diffraction analysis. The best-fit structure was consistent with findings of previous studies [Phys. Rev. Lett. 95 (2005) 076103 and Phys. Rev. Lett. 103 (2009) 017601]. The unit cell is c(2 x 2)-Si2O5 and is composed of a two-dimensional network of SiO4 tetrahedrons. The tetrahedrons incline slightly to fit the silica network on the Mo(112) surface while maintaining the ideal Si-O bond length. Since there are no dangling bonds in the silica network, the surface is very stable even in the atmosphere. (C) 2011 Elsevier B.V. All rights reserved.
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