Evaluation of carbon incorporation and strain of doped MgB2 superconductor by Raman spectroscopy

SCRIPTA MATERIALIA

卷:64

Article

Yeoh, W. K.¹  Zheng, R. K.¹  Ringer, S. P.¹  Li, W. X.²  Xu, X.²  Dou, S. X.²  Chen, S. K.³  MacManus-Driscoll, J. L.⁴ 

[1] Univ Sydney, Australian Ctr Microscopy & Microanal, Sydney, NSW 2006, Australia

[2] Univ Wollongong, Inst Superconducting & Elect Mat, Wollongong, NSW 2522, Australia

[3] Univ Putra Malaysia, Fac Sci, Dept Phys, Serdang 43400, Selangor, Malaysia

[4] Univ Cambridge, Dept Mat Sci & Met, Cambridge CB2 3QZ, England

关键词: Raman spectroscopy;    X-ray diffraction;    Superconductors;    Carbon doping;   

DOI  :  10.1016/j.scriptamat.2010.10.025

来源: Elsevier

【 摘 要 】

Raman spectroscopy is employed to study both the strain and the carbon substitution level in SiC-doped MgB2 bulk samples. Raman spectroscopy was demonstrated to be a better method to distinguish the individual influences of strain and carbon than standard X-ray diffraction. It is found that the lattice parameter correlation method for C content determination is invalid for highly strained samples. Our result also provides an alternative explanation for lattice variation in non-carbon-doped MgB2, which is basically due to lattice strain. (C) 2010 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

【 授权许可】

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