Room temperature plasticity in thermally grown sub-micron oxide scales revealed by micro-cantilever bending

SCRIPTA MATERIALIA

卷:144

Article

Iyer, Anand H. S.¹  Stiller, Krystyna¹  Colliander, Magnus Hornqvist¹ 

[1] Chalmers Univ Technol, Dept Phys, S-41296 Gothenburg, Sweden

关键词: Focused ion beam (FIB);    Scanning electron microscopy (SEM);    Crystalline oxides;    Plastic deformation;    Micro-mechanical testing;   

DOI  :  10.1016/j.scriptamat.2017.09.036

来源: Elsevier

【 摘 要 】

We propose a new geometry for focused ion beam milled micro-cantilevers, which allows production of residual stress-free, isolated thin film specimens from film-substrate systems. This geometry was used to demonstrate the presence of permanent deformation in about 200 nm thick thermally grown oxide scales on a Ni-base superalloy, after applying large bending displacements in-situ in a scanning electron microscope. Stiffness measurements performed before and after the bending tests confirmed the absence of micro-cracks, leading to the conclusion that plastic deformation occurred in the oxide scale. The proposed method is extendable to other film-substrate systems and testing conditions, like non-ambient temperatures. (C) 2017 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

【 授权许可】

Free