Power-law scaling regimes for solid-state dewetting of thin films

SCRIPTA MATERIALIA

卷:116

Article

Zucker, Rachel V.¹  Carter, W. Craig²  Thompson, Carl V.³ 

[1] Univ Calif Berkeley, Dept Mat Sci & Engn, 475 Hearst Mem Min Bldg, Berkeley, CA 94720 USA

[2] MIT, Dept Mat Sci & Engn, 13-4053 77 Massachusetts Ave, Cambridge, MA 02139 USA

[3] MIT, Dept Mat Sci & Engn, 13-5069 77 Massachusetts Ave, Cambridge, MA 02139 USA

关键词: Dewetting;    Surface energy;    Morphological evolution;    Thin film;    Capillary forces;   

DOI  :  10.1016/j.scriptamat.2016.01.039

来源: Elsevier

【 摘 要 】

The capillary force drives the edges of solid thin films to retract. The distance a film edge has retracted over time is usually fitted to a power law. However, experiments and numerical simulations suggest that edge retraction does not follow a power-law. In this work, a simple geometric model for edge retraction is presented that reproduces the retraction distance versus time scalings of simulations for both isotropic and highly-anisotropic films, and is consistent with experiments. The earliest time at which a power-law fit becomes a reasonable approximation is calculated as a function of substrate-film contact angle. (C) 2016 Elsevier Ltd. All rights reserved.

【 授权许可】

Free