Kossel diffraction observed with X-ray color camera during PIXE of nano-scale periodic multilayer

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS

卷:450

Article; Proceedings Paper

Wu, Meiyi^1,2  Le Guen, Karine^1,2  Andre, Jean-Michel^1,2  Jonnard, Philippe^1,2  Vickridge, Ian^3,4  Schmaus, Didier^3,4  Briand, Emrick^3,4  Waltere, Philippe^5,6  Huang, Qiushi⁷  Wang, Zhanshan⁷ 

[1] UPMC Univ Paris 06, Sorbonne Univ, Lab Chim Phys Matiere & Rayonnement, Boite Courier 1140,4 Pl Jussieu, F-75252 Paris 05, France

[2] CNRS, UMR 7614, Lab Chim Phys Matiere & Rayonnement, Boite Courier 1140,4 Pl Jussieu, F-75252 Paris 05, France

[3] UPMC Univ Paris 06, Sorbonne Univ, Inst NanoSci Paris, 4 Pl Jussieu,Boite Courrier 840, F-75252 Paris 05, France

[4] CNRS, UMR 7588, Inst NanoSci Paris, 4 Pl Jussieu,Boite Courrier 840, F-75252 Paris 05, France

[5] UPMC Univ Paris 06, Sorbonne Univ, Lab Archeol Mol & Struct, 4 Pl Jussieu, F-75005 Paris, France

[6] CNRS, UMR 8220, Lab Archeol Mol & Struct, 4 Pl Jussieu, F-75005 Paris, France

[7] Tongji Univ, Sch Phys Sci & Engn, Inst Precis Opt Engn, Key Lab Adv Microstruct Mat, Shanghai 200092, Peoples R China

关键词: PIXE;    Periodic multilayer;    Kossel diffraction;   

DOI  :  10.1016/j.nimb.2018.08.008

来源: Elsevier

【 摘 要 】

By combining Kossel diffraction with particle induced X-ray emission, we have developed a new methodology to analyze nano-scale thin films. We report the Kossel diffraction generated by irradiating Pd/Y based nano-scale periodic multilayers with 2 MeV protons. The intensity of characteristic Pd L alpha X-ray emission is measured as a function of the detection angle (grazing exit). An oscillation of its intensity is observed when the detection angle varies around the Bragg angle, which corresponds to the energy of the emission and the period of the multilayer. Use of the X-ray color camera enables the whole setup to be fixed so that no angular scan is required, greatly simplifying the experimental condition. From the features of the Kossel curves, we are able to deduce that nitrided Pd/Y multilayers exhibit much less layer intermixing than the non-nitrided multilayers. The experimental results show that it is possible to distinguish by the shape of Kossel curves of multilayers with B4C barrier layers located in different interfaces. This demonstrates that Kossel diffraction is structural sensitive.

【 授权许可】

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