Cross sections of X-ray production induced by C and Si ions with energies up to 1 MeV/u on Ti, Fe, Zn, Nb, Ru and Ta

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS

卷:406

Article; Proceedings Paper

Emilio Prieto, Jose^1,2,3  Zucchiatti, Alessandro¹  Galan, Patricia¹  Prieto, Pilar⁴ 

[1] Univ Autonoma Madrid, CMAM, E-28049 Madrid, Spain

[2] Univ Autonoma Madrid, Dept Fis Mat Condensada, IFIMAC, Cantoblanco, E-28049 Madrid, Spain

[3] Univ Autonoma Madrid, Inst Nicolas Cabrera, E-28049 Madrid, Spain

[4] Univ Autonoma Madrid, Dept Fis Aplicada, E-28049 Madrid, Spain

关键词: Heavy ion PIXE;    X-ray cross sections;    Ti;    Fe;    Zn;    Ta;    Ru;    Nb;   

DOI  :  10.1016/j.nimb.2017.01.047

来源: Elsevier

【 摘 要 】

X-ray production differential cross sections induced by C and Si ions with energies from 1 MeV/u down to 0.25 MeV/u, produced by the CMAM 5 MV tandem accelerator, have been measured for thin targets of Ti, Fe, Zn, Nb, Ru and Ta in a direct way. X-rays have been detected by a fully characterized silicon drift diode and beam currents have been measured by a system of two Faraday cups. Measured cross sections agree in general with previously published results. The ECPSSR theory with the united atoms correction gives absolute values close to the experimental ones for all the studied elements excited by C ions and for Ta, Nb and Ru excited by Si ions. For Ti, Fe and Zn excited by Si, the matching with theory is poor since even the ionization cross section is below the measured data. (c) 2017 Elsevier B.V. All rights reserved.

【 授权许可】

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