A large area high resolution imaging detector for fast atom diffraction

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS

卷:427

Article; Proceedings Paper

Lupone, Sylvain¹  Soulisse, Pierre¹  Roncin, Philippe¹ 

[1] Univ Paris Saclay, Univ Paris Sud, ISMO, CNRS, F-91405 Orsay, France

关键词: Fast atom diffraction;    Reflexion high energy electron diffraction;    Imaging detector;   

DOI  :  10.1016/j.nimb.2018.04.030

来源: Elsevier

【 摘 要 】

We describe a high resolution imaging detector based on a single 80 mm micro-channel-plate (MCP) and a phosphor screen mounted on a UHV flange of only 100 mm inner diameter. It relies on standard components and we describe its performance with one or two MCPs. A resolution of 80 pm rms is observed on the beam profile. At low count rate, individual impact can be pinpointed with few pm accuracy but the resolution is probably limited by the MCP channel diameter. The detector has been used to record the diffraction of fast atoms at grazing incidence on crystal surfaces (GIFAD), a technique probing the electronic density of the topmost layer only. The detector was also used to record the scattering profile during azimuthal scan of the crystal to produce triangulation curves revealing the surface crystallographic directions of molecular layers. It should also be compatible with reflection high energy electron (RHEED) experiment when fragile surfaces require a low exposure to the electron beam. The discussions on the mode of operation specific to diffraction experiments apply also to commercial detectors.

【 授权许可】

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