期刊论文详细信息
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 卷:382
Active correction of the tilt angle of the surface plane with respect to the rotation axis during azimuthal scan
Article; Proceedings Paper
Sereno, M.1  Lupone, S.1  Debiossac, M.1  Kalashnyk, N.1  Roncin, P.1 
[1] Univ Paris Saclay, Univ Paris 11, CNRS, ISMO, F-91405 Orsay, France
关键词: Grazing incidence;    Surface science;    Fast atom diffraction;    Triangulation;   
DOI  :  10.1016/j.nimb.2016.05.001
来源: Elsevier
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【 摘 要 】

A procedure to measure the residual tilt angle a between a flat surface and the azimuthal rotation axis of the sample holder is described. When the incidence angle theta and readout of the azimuthal angle 0 are controlled by motors, an active compensation mechanism can be implemented to reduce the effect of the tilt angle during azimuthal motion. After this correction, the effective angle of incidence is kept fixed, and only a small residual oscillation of the scattering plane remains. (C) 2016 Elsevier B.V. All rights reserved.

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