Temporally resolved LEIS measurements of Cr segregation after preferential sputtering of WCrY alloy

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS

卷:479

Article

Koslowski, H. R.¹  Schmitz, J.^1,2  Linsmeier, Ch.¹ 

[1] Forschungszentrum Julich, Inst Energie & Klimaforsch Plasmaphys, D-52425 Julich, Germany

[2] Univ Ghent, Dept Appl Phys, B-9000 Ghent, Belgium

关键词: Low energy ion scattering (LEIS);    Segregation;    Preferential sputtering;    Plasma-wall interaction;    WCrY;   

DOI  :  10.1016/j.nimb.2020.06.005

来源: Elsevier

【 摘 要 】

The dynamic behaviour of thermally driven segregation of Cr to the surface of WCrY smart alloy is studied with low energy ion scattering (LEIS). Sputtering the WCrY sample with 500 eV D-2(+) ions at room temperature results in preferential removal of the lighter alloy constituents and causes an almost pure W surface layer. At elevated temperatures above 700 K the segregation of Cr atoms towards the surface sets in and prevents the formation of a pure W layer. The simultaneous heating and sputtering of the sample leads to a surface state which reflects the balance between sputter removal and segregation flux, and deviates from the equilibrium due to thermally driven segregation. Stopping the sputter ion beam allows the system to relax and develop toward the segregation equilibrium. The time constants for the temporal changes of W and Cr surface coverage are obtained from a series of LEIS measurements. The segregation enthalpy is determined from the time constants obtained for various sample temperatures.

【 授权许可】

Free