Electronic sputtering of solid N2 by swift ions

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS

卷:485

Article

Dartois, E.¹  Chabot, M.²  Barkach, T. Id²  Rothard, H.³  Boduch, P.³  Auge, B.⁴  Duprat, J.^2,5  Rojas, J.² 

[1] Univ Paris Saclay, Inst Sci Mol Orsay, CNRS, UMR8214, F-91405 Orsay, France

[2] Univ Paris Saclay, Lab Phys Deux Infinis Irene Joliot Curie, CNRS, IN2P3, F-91405 Orsay, France

[3] Normandie Univ, Ctr Rech Ions Mat & Photon, ENSICAEN, CIMAP,CIRIL,GANIL,UNICAEN,CEA,CNRS, F-14000 Caen, France

[4] Univ Grenoble Alpes, CNRS, Inst Planetol & Astrophys Grenoble, F-38000 Grenoble, France

[5] Sorbonne Univ, Inst Mineral Phys Mat & Cosmochimie, CNRS, MNHN,UMR7590, 57 Rue Cuvier, F-75005 Paris, France

关键词: Electronic sputtering;    Radiation chemistry;    Heavy ions;    Solid N-2;    Sputtering crater;   

DOI  :  10.1016/j.nimb.2020.10.008

来源: Elsevier

【 摘 要 】

Most sputtering yield measurements for solid N-2 are reported for stopping powers lower than 10(-13) eV cm(2)/molecule. We measured the sputtering yield for solid N-2 at stopping powers, in the electronic regime, above 10(-12) eV cm(2)/molecule, extending the range of such measurements by more than an order of magnitude, using a 33 (MeVNi9+)-Ni-58 swift heavy ions beam. The evolution of the thin N-2 ice films was monitored in-situ by mid-infrared spectroscopy (FTIR) during irradiation. As N-2 is only weakly infrared active, and can be hardly monitored directly via an infrared absorption mode in such experiments, we use the Fabry-Perot interference fringes of the ice film to evaluate, via an optical model, the erosion of the N-2 film as a function of ion fluence. A sputtering model including several sputtering crater shapes is developed and tested against experimental data. We derive the sputtering yield for a semi-infinite N-2 ice film and its dependence with the ice thickness for thin film conditions, monitoring the N-2 ice sputtering depth. We combine the results with previous measurements at lower stopping powers to derive the electronic sputtering of solid N-2 over a large stopping power range.

【 授权许可】

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