Fast method for the estimation of the absorbed dose in X-ray microtomography

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS

卷:452

Article

De Muynck, Amelie¹  Bonte, Stijn^1,3  Dhaene, Jelle¹  Dierick, Manuel^1,4  Bacher, Klaus²  Van Hoorebeke, Luc¹  Boone, Matthieu N.¹ 

[1] Univ Ghent, UGCT Dept Phys & Astron, Proeftuinstr 86, B-9000 Ghent, Belgium

[2] Univ Ghent, Div Med Phys Gent, Dept Basic Med Sci, Ghent, Belgium

[3] Univ Ghent, Dept Elect & Informat Syst, Med Imaging & Signal Proc MEDISIP, IBiTech, Campus Heymans Block B,De Pintelaan 185, B-9000 Ghent, Belgium

[4] XRE Nv, Bollebergen 2B Box 1, B-9052 Ghent, Belgium

关键词: Computed tomography;    Absorbed dose;    Micro-CT;   

DOI  :  10.1016/j.nimb.2019.05.055

来源: Elsevier

【 摘 要 】

Micro-CT imaging is an increasingly popular tool in the internal investigation of objects and materials. However, as an X-ray based technique, a potentially harmful radiation dose is deposited in the sample during the measurement. In (non small-animal) micro-CT imaging one is dealing with a strong variation in measurement systems and settings, resulting in many different acquisition circumstances and the absence of standard imaging protocols. Therefore, the deposited dose is rarely studied for micro-CT applications. This research aimed at developing a fast simulation technique to predict the dose associated with micro-CT scanning. Its performance is compared with that of two different Monte Carlo simulation tools and with a straight forward approach to estimate an upper limit for the dose. The fast simulation method, obtaining a dose estimation based on the energy absorption coefficient, is much faster than the Monte Carlo simulations, and the results are accurate within 30%. This enables us to predict the dose for a known sample and a known scanner setup, without complex Monte Carlo simulations and will allow researchers to avoid radiation damage or unwanted radiation induced effects, an increasingly important concern in 3D and 4D micro-CT scanning.

【 授权许可】

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