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THIN SOLID FILMS 卷:520
Fabrication, structural and electrical characterization of lanthanum tungstate films by pulsed laser deposition
Article
Vollestad, Einar1  Gorzkowska-Sobas, Agnieszka1  Haugsrud, Reidar1 
[1] Univ Oslo, FERMiO, Dept Chem, Ctr Mat Sci & Nanotechnol, N-0349 Oslo, Norway
关键词: Proton conducting oxide;    Ceramics;    Hydrogen transport membrane;    Films by pulsed laser deposition;    Ionic conductor;    Lanthanum tungstate;    La6WO12;   
DOI  :  10.1016/j.tsf.2012.06.060
来源: Elsevier
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【 摘 要 】

Films of lanthanum tungstate, 3 mu m in thickness, were fabricated by means of pulsed laser deposition on a Pd foil. The films were characterized by X-ray diffraction, scanning electron microscopy, X-ray photoelectron spectroscopy and their electrical conductivity was measured at temperatures between 400 and 800 degrees C in different gas atmospheres. The films' structure and electrical characteristics are close to what is reported in the literature for corresponding polycrystalline material. The films exhibit fairly high proton conductivity at elevated temperatures, which make them interesting for components in hydrogen-related technologies. Changes in microstructure and the crystallographic orientation observed at higher temperatures were accompanied by changes in the conductivity characteristics. (C) 2012 Elsevier B.V. All rights reserved.

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