Investigation of Cu-poor and Cu-rich Cu(In,Ga)Se2/CdS interfaces using hard X-ray photoelectron spectroscopy

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卷:582

Article; Proceedings Paper

Uemsuer, B.¹  Calvet, W.¹  Hoepfner, B.¹  Steigert, A.¹  Lauermann, I.¹  Gorgoi, M.¹  Prietzel, K.¹  Navirian, H. A.¹  Kaufmann, C. A.¹  Unold, T.¹  Lux-Steiner, M. Ch.^1,2 

[1] Helmholtz Zentrum Berlin, D-14109 Berlin, Germany

[2] Free Univ Berlin, Dept Phys, D-14195 Berlin, Germany

关键词: Chalcopyrite;    Hard X-ray photoelectron spectroscopy;    Cd diffusion;    Interface;   

DOI  :  10.1016/j.tsf.2014.08.049

来源: Elsevier

【 摘 要 】

Cu-poor and Cu-rich Cu(In,Ga)Se-2 (CIGSe) absorbers were used as substrates for the chemical bath deposition of ultrathin CdS buffer layers in the thickness range of a few nanometers in order to make the CIGSe/CdS interface accessible by hard X-ray photo-emission spectroscopy. The composition of both, the absorber and the buffer layer as well as the energetics of the interface was investigated at room temperature and after heating the samples to elevated temperatures (200 degrees C, 300 degrees C and 400 degrees C). It was found that the amount of Cd after the heating treatment depends on the near surface composition of the CIGSe absorber. No Cd was detected on the Cu-poor surface after the 400 degrees C treatment due to its diffusion into the CIGSe layer. In contrast, Cd was still present on the Cu-rich surface after the same treatment at 400 degrees C. (C) 2014 Elsevier B.V. All rights reserved.

【 授权许可】

Free