| THIN SOLID FILMS | 卷:633 |
| On a better estimate of the charge collection function in CdTe solar cells: Al2O3 enhanced electron beam induced current measurements | |
| Article; Proceedings Paper | |
| Bissig, Benjamin1  Lingg, Martina1  Guerra-Nunez, Carlos2  Carron, Romain1  La Mattina, Fabio3  Utke, Ivo2  Buecheler, Stephan1  Tiwari, Ayodhya N.1  | |
| [1] Empa Swiss Fed Labs Mat Sci & Technol, Lab Thin Films & Photovolta, Ueberlandstr 129, CH-8600 Dubendorf, Switzerland | |
| [2] Empa Swiss Fed Labs Mat Sci & Technol, Lab Mech Mat & Nanostruct, Feuerwerkerstr 39, CH-3602 Thun, Switzerland | |
| [3] Empa Swiss Fed Labs Mat Sci & Technol, Reliabil Sci & Technol Lab, Ueberlandstr 129, CH-8600 Dubendorf, Switzerland | |
| 关键词: Electron beam induced current; Alumina; Passivation; CdTe; Surface recombination; Chalcogenide; | |
| DOI : 10.1016/j.tsf.2016.08.012 | |
| 来源: Elsevier | |
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【 摘 要 】
The electron beam induced current technique (EBIC) was applied to substrate configuration CdTe solar cells in order to estimate the current density loss due to incomplete charge collection. In order to improve the measurement accuracy a thin Al2O3 layer was deposited on the device cross section by atomic layer deposition. Absorption coefficients and internal quantum efficiency (IQE) of the CdTe absorber layer and device were derived from reflection and transmission measurements. An estimate for the IQ); was then calculated from EBIC measurements for devices with and without Al2O3 coating. The comparison of this estimate to the measured IQE shows that the Al2O3 enhances the accuracy of the EBIC measurements. Details of the EBIC profile and an estimate for the residual IQE i.e. current loss are discussed. Finally, a tentative explanation for the improved accuracy of the Al2O3 enhanced EBIC measurement is presented. (C) 2016 Elsevier B.V. All rights reserved.
【 授权许可】
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【 预 览 】
| Files | Size | Format | View |
|---|---|---|---|
| 10_1016_j_tsf_2016_08_012.pdf | 780KB |
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