Influence of the bias voltage on the structure and the tribological performance of nanoscale multilayer C/Cr PVD coatings

THIN SOLID FILMS

卷:475

Article; Proceedings Paper

Kok, YN ; Hovsepian, PE ; Luo, Q ; Lewis, DB ; Wen, JG ; Petrov, I

关键词: sputtering;    C/Cr coating;    bias voltage;    tribology;    microstructure;   

DOI  :  10.1016/j.tsf.2004.08.042

来源: Elsevier

【 摘 要 】

Nanoscale multilayer C/Cr coatings have been deposited by utilising the combined steered cathodic arc/unbalanced magnetron sputtering technique. The coating microstructure and tribological performance have been investigated as a function of the bias voltage, ranging from U-b=-65 to -350 V. The XRD results revealed that C/Cr coatings are amorphous at low U-b, but became more crystalline when the Ub increased to -350 V. High-resolution XTEM analysis indicated coating densification and smoothening as well as formation of novel amorphous nanostructure, in which carbon-rich clusters are surrounded by a Cr-rich matrix, leading to the formation of self-organised multilayer structure as the bias voltage was increased from -65 to -350 V. An increase of the bias voltage from -65 to -350 V resulted in an increase in the hardness from 8 to 25 CiPa and Young's modulus, E from 186 to 319 GPa. A pin-on-disc test showed that the friction coefficient was reduced from 0.22 to 0.16 when the bias voltage was increased from -65 to -95 V However, a further increase in the bias voltage to -350 V led to an increase in the friction coefficient to 0.31. The lowest wear coefficient K(c)similar to6.25 x 10(-17) m(3) N-1 m(-1) was achieved at U-b = - 120 V. Standard HSS drills, 8 mm in diameter, coated with C/Cr have been tested using solution annealed AISI 304 stainless steel as the work piece material. An improvement of the lifetime by a factor of similar to9 has been achieved as compared to the uncoated tools. In this test, the C/Cr coating outperformed a number of commercially available PVD coatings, such as TiCN, TiAlCrN and showed similar performance to TiAlCrYN. (C) 2004 Elsevier B.V. All rights reserved.

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