期刊论文详细信息
| THIN SOLID FILMS | 卷:515 |
| Growth and characterization of group-III impurity-doped semiconducting BaSi2 films grown by molecular beam epitaxy | |
| Article; Proceedings Paper | |
| Kobayashi, M. ; Morita, K. ; Suemasu, T. | |
| 关键词: BaSi2; molecular beam epitaxy; | |
| DOI : 10.1016/j.tsf.2007.02.050 | |
| 来源: Elsevier | |
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【 摘 要 】
Ga- or In-doped BaSi2 films were grown on Si(III) by molecular beam epitaxy (MBE). The Ga-doped BaSi2 showed n-type conductivity. The electron concentration and resistivity of the Ga-doped BaSi2 depended on the Ga temperature; however, the electron concentration and resistivity could not be controlled properly. In contrast, the In-doped BaSi2 showed p-type conductivity and its hole concentration was controlled in the range between 10(16) and 10(17) cm(-3) at RT. (c) 2007 Elsevier B.V. All rights reserved.
【 授权许可】
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【 预 览 】
| Files | Size | Format | View |
|---|---|---|---|
| 10_1016_j_tsf_2007_02_050.pdf | 367KB |
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