Nanoscale structural characterization of manganite thin films integrated to silicon correlated with their magnetic and electric properties

THIN SOLID FILMS

卷:709

Article

Carrero, Aneely^1,2,3  Roman, Augusto^1,2,3  Aguirre, Myriam^4,5,6,7  Steren, Laura B.^1,2,3 

[1] Inst Nanociencia & Nanotecnol, RA-1650 San Martin, Buenos Aires, Argentina

[2] Consejo Nacl Invest Cient & Tecn, C1425FQB, Buenos Aires, DF, Argentina

[3] Ctr Atom Constituyentes, Dept Mat Condensada, Lab Nanoestructuras Magnet & Dispositivos, RA-1650 San Martin, Buenos Aires, Argentina

[4] Univ Zaragoza, Dept Fis Mat Condensada, E-50009 Zaragoza, Spain

[5] CSIC, Inst Univ Nanociencia Aragon, E-50018 Zaragoza, Spain

[6] CSIC, Inst Ciencia Mat Aragon, E-50018 Zaragoza, Spain

[7] Univ Zaragoza, Lab Microscopias Avanzadas, E-50018 Zaragoza, Spain

关键词: Nanoscale structure;    Oxides;    Pulsed Laser Deposition;    ferromagnetism;   

DOI  :  10.1016/j.tsf.2020.138189

来源: Elsevier

【 摘 要 】

A detailed nanoscale structural characterization was performed on high-quality La0.66Sr0.33MnO3 (LSMO) thin films of different thicknesses and deposited by pulsed laser deposition onto buffered Si (100) substrates. A multilayered structure built of Y0.13Zr0.87O2 (YSZ) and CeO2 layers was used as buffer in order to optimize the manganite films growth. The stacking of the different layers, their morpholohy, composition and strains were analysed using different experimental techniques. In-situ characterization of the films, performed with reflection high-energy electron diffraction, revealed their epitaxial growth and smooth surfaces. High-resolution transmission electron microscopy (HR-TEM) images showed sharp interfaces between the constituents lattices and combined with energy-dispersive X-ray analysis allowed us to determine that there was no ion interdifussion across them. The Fourier-Fast-Transform of the HR-TEM images was used to resolve the epitaxy relationship between the layers, resulting in [100] LSMO (001) parallel to [110] CeO2 (001) parallel to [110] YSZ (001) parallel to [110] Si (001). The LSMO thin films were found to be ferromagnetic and metallic at low temperature regardless their thickness. The effect of strains and defects was only detected in films thinner than 15 nm and put in evidence by X-ray diffraction patterns and correlated with magnetic and electrical parameters.

【 授权许可】

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