A comparative transmission electron microscopy, energy dispersive x-ray spectroscopy and spatially resolved micropillar compression study of the yttria partially stabilised zirconia - porcelain interface in dental prosthesis

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Article

Lunt, Alexander J. G.¹  Mohanty, Gaurav²  Ying, Siqi¹  Dluhos, Jiri³  Sui, Tan¹  Neo, Tee K.⁴  Michler, Johann²  Korsunsky, Alexander M.¹ 

[1] Univ Oxford, Dept Engn Sci, Oxford OX1 3PJ, England

[2] EMPA Mat Sci & Technol, CH-3602 Thun, Switzerland

[3] TESCAN Brno Sro, Brno 62300, Czech Republic

[4] Mt Elizabeth Orchard, Spedalist Dent Grp, Singapore 228510, Singapore

关键词: Yttria partially stabilised zirconia-porcelain interface;    Scanning electron microscopy;    Transmission electron microscopy;    Energy dispersive X-ray spectroscopy;    Micropillar compression/microcompression;   

DOI  :  10.1016/j.tsf.2015.07.070

来源: Elsevier

【 摘 要 】

Recent studies into the origins of failure of yttria partially stabilised zirconia-porcelain veneered prosthesis have revealed the importance of micro-to-nano scale characterisation of this interface zone. Current understanding suggests that the heat treatment, residual stresses and varying microstructure at this location may contribute to near-interface porcelain chipping. In this study the chemical, microstructural and mechanical property variation across the interfacial zone has been characterised at two differing length scales and using three independent techniques; energy dispersive X-ray spectroscopy, transmission electron microscopy and micropillar compression. Energy dispersive X-ray spectroscopy mapping of the near-interface region revealed, for the first time, that the diffusional lengths of twelve principal elements are limited to within 2-6 mu m of the interface. This study also revealed that 0.2-2 mu m diameter zirconia grains had become detached from the bulk and were embedded in the near-interface porcelain. Transmission electron microscopy analysis demonstrated the presence of nanoscale spherical features, indicative of tensile creep induced voiding, within the first 0.4-1.5 mu m from the interface. Within zirconia, variations in grain size and atomistic structure were also observed within the 3 mu m closest to the interface. Micropillar compression was performed over a 100 mu m range on either side of the interface at the spatial resolution of 5 mu m. This revealed an increase in zirconia and porcelain loading modulus at close proximities (<5 mu m) to the interface and a decrease in zirconia modulus at distances between 6 and 41 mu m from this location. The combination of the three experimental techniques has revealed intricate details of the microstructural, chemical and consequently mechanical heterogeneities in the YPSZ-porcelain interface, and demonstrated that the length scales typically associated with this behaviour are approximately +/- 5 mu m. (C) 2015 Elsevier B.V. All rights reserved.

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