Large deviations in the van der Waals limit

STOCHASTIC PROCESSES AND THEIR APPLICATIONS

卷:75

Article

Benois, O ; Bodineau, T ; Presutti, E

关键词: Kac potentials;    large deviations;    interfaces;    Wulff shape;    contours;   

DOI  :  10.1016/S0304-4149(98)00002-7

来源: Elsevier

【 摘 要 】

In this paper we extend the analysis in Benois et al. (Markov Process. Rel. Fields (1997) 175-198) by proving a strong large deviation principle for the empirical distribution of Ising spins in d greater than or equal to 2 dimensions when the interaction is determined by a Kac potential and the temperature is below the critical value. (C) 1998 Elsevier Science B.V. All rights reserved.

【 授权许可】

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