Low Energy X-ray Photons Induced Changes in Lexan Films

Indian Journal of Pure & Applied Physics

article

Raveesha P M¹  Hareesh K²  Dhamgaye V P³  Dhole S D⁴  Ganesh Sanjeev¹ 

[1] Microtron Centre, Department of Studies in Physics, Mangalore University;School of Applied Sciences ,(Physics), REVA University;Raja Ramanna Centre for Advanced Technology;Savithribhai Phule Pune University

关键词: Lexan films;    X-ray photons;    XRD;    FTIR;    Microhardness;    SEM;    Contact angle;    Article;   

来源: National Institute of Science Communication and Information Resources

【 摘 要 】

40 keV Synchrotron X-ray photons were made to fall on Lexan polycarbonate films at different exposure time. The low energy X-ray photons assisted modification in terms of physico-chemical properties of Lexan films were studied using Fourier Transform Infrared (FTIR) spectrophotometer, X-Ray Diffractogram (XRD), Vicker’s Microhardness Tester, Scanning Electron Microscope (SEM) and Contact Angle Meter. FTIR result mainly includes decrease in the C=C stretching and C-C stretching of aromatics after irradiation. XRD analysis shows a slight decrease in the crystallinity after irradiation. Vicker’s microhardness test reveals the decrement in microhardness of Lexan films after irradiation. SEM result shows irradiation induced changes in the surface morphology. Contact angle measurement shows increase in the water contact angle in irradiated Lexan films.

【 授权许可】

Unknown